Activities 2

Technology Laboratory activities

Environmental Testing area
Technology Laboratory activities were started by IMT in April 2008 in Valenzano (Bari) plant c/o Tecnopolis Technological Park. IMT is equipped with a large number of Thermal chambers to perform various temperature tests, Thermal Cycles, Thermal Shocks and Humidity tests according to applicable MIL, NASA and ESA standards. Furthermore, several automatic electrical test equipments or PC controlled are available to perform electrical tests on analogue, digital and radiofrequency components (up to 40 GHz and more).
As of today, the dedicated manpower consists of:
VALENZANO (BARI)6 Engineers    See location
ROME4 Engineers    See location

Testing capability

Destructive Physical AnalysisHighly-Accelerated Temperature and Humidity Stress Test (HAST)
Failure AnalysisElectrical test characterization  (also at RF up to 40 Ghz)
Construction AnalysisThermal Shock (air-air / liquid-liquid)
Up-screeningHumidity Test 85°C/85%RH
High Stabilization BakeRadiation test –TID – DD – SEE
Burn-inLife test
RelifeHermeticity test
XraysCSAM

Measurement Test Equipments

Analogue, digital and radiofrequency (up to 40 GHz) electrical tests (at ambient, low and high temperatures; -65°C ÷ +165°C) on EEE (Electrical, Electronic, Electro‐Mechanical) parts are performed with a large number of automatic and PC controlled electrical test equipments.

Besides standard instrumentation, the following equipments are available:

HP4142B – Semiconductor Parameters DC Analyzer (3 units)

Spectrum Analyzer up to 43,5 GHz
HP4085M – 48 Pins Switching MatrixN5224A – AGILENT Network Analyzer (10MHz ÷ 43.5GHz)
Thermostream – per High/Low Temperature Test E4419B – Agilent Power Meter (4 units)
HP4275A – LCR Meter for passive components testSignal Generators  up to 43,5 GHz (3 units)
33250A – Agilent Function GeneratorNI PIXIe – National Instruments ATE – Source/Monitor Unit (2 units)

P.I.N.D. Test
P.I.N.D. Test


Hermeticity Test (Fine Leak)
Hermeticity Test (Fine Leak)


Hermeticity Test (Gross Leak)
Hermeticity Test (Gross Leak)

Scanning Electronic Microscope (SEM) and EDX
Scanning Electronic Microscope (SEM) and EDX

Environmental Testing Chambers

EquipmentManufacturerModelDescription
Thermal ChamberA.C.S.CSTL12Thermal Shocks liquid to liquid (-75; +200°C)
Thermal ChamberA.C.S.CST 110/3D3Thermal Shocks air to air (-60; +175°C)
ClimaticChamberA.C.S.SYSTEM CNS 500Salt spray test Chamber
Thermal ChamberWEISS/MAZZALI 80/80 180 DUThermostatic chamber cold-hot (-70; +200°C)
Thermal ChamberMAZZALIA530H1Thermostatic chamber cold-hot (-70; +125°C)
Thermal ChamberMAZZALIA530H1Thermostatic chamber cold-hot (-70; +125°C)
Thermal ChamberMAZZALIA530Q1Thermostatic chamber hot-hot (+40; +250°C)
Thermal ChamberMAZZALIA530Q1Thermostatic chamber hot-hot (+40; +250°C)
ClimaticChamberMAZZALIC330G5Climatic chamber hotcold- humidity (-30; +100°C; 100%RH)
ClimaticChamberMAZZALIC330G5Climatic chamber hotcold- humidity (-30; +100°C; 100%RH)
Pressure cookerWEISS/MAZZALIPCK 75/155Pressure cooker (95%RH up to 170°C)
Heating OvenBINDERFD53 CI.2Temperature range from 5 °C above ambient temperature  to 300 °C
SEE Test Facility
SEE Test Facility c/o LNS-INFN Catania (Italy)
CO60- Radiation Source c/o ENEA Casaccia
CO60- Radiation Source c/o ENEA Casaccia - Roma (Italy)